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How 5G is Influencing Silicon Design

5G is introducing a wide array of challenges in next-generation SoCs that go well beyond high bandwidth wireless.

Industrial IoT Opportunities in Semiconductors

Fortune Business Insights projects the industrial automation market size of $157.04B in 2018 growing to over $296.7B in 2026 at an 8.4% CAGR1. This growth will have direct impact on new ...

Addressing the Evolving Technology Needs of Cloud Data Centers with IP

In this paper we will examine some of the challenges system on chip (SoC) developers are facing to meet modern cloud infrastructure demands, and the tools and technologies that can be used to ...

Testing PCI Express 5.0 PHY Transmitter Performance Without Analysis Software

This white paper explains how to characterize PCIe 5.0 PHY designs to avoid issues such as signal integrity and reliability prior to manufacturing.

Importance of Dependent Failure Analysis for Safety-Critical IP and SoCs

This white paper explains the importance of implementing DFA in the automotive IP and SoC development cycle and how DFA helps meet the technical independence essentials according to the design’s ...

USB4: User Expectations Drive Design Complexity

This white paper outlines the capabilities of USB4 Hosts, Hubs, Docks, and Devices with an emphasis on how end-user expectations drive the complexity of USB4 products.

Holistic Verification and Validation of Automotive IP for Functional Safety SoCs

This white paper illustrates a holistic approach to verification and validation of automotive IP for functional safety products and how such a holistic approach eliminates costly iterations and ...

Neuromorphic Computing Drives the Landscape of Emerging Memories for ...

This white paper describes two major developments that have opened the doors to implementing new techniques in machine learning. First, vast amounts of data, i.e., “Big Data,” are available for ...

Testing PCI Express® 5.0 PHY Receiver Performance in the Absence of a ...

This white paper describes a methodology for jitter tolerance testing without using the controller to negotiate a link. In addition, the paper outlines a procedure for calibrating the stressed eye ...

Testing Embedded MRAM IP for SoCs

The challenges of embedded memory test and repair are well known, including maximizing fault coverage to prevent test escapes and using spare elements to maximize manufacturing yield. With the ...